[tests] Change PWM pins to better match e-series pinout for E SoM X. Fix other tests

[scott-brust]

Problem

There are many device-os-test-runner failures for the new esomx platform. Most are pin and PWM related due to the new platform pinmap. This PR does not fix all of them (yet)

Solution

For PWM, the general solution was to make the esomx pinmap be as close to the e-series pinmap as possible. see ticket here for details.

Steps to Test

Build and Run the device-os-test-runner for esomx:

device-os-test --device-os-dir=/Users/scottbrust/develop/device-os/ --test-dir=/Users/scottbrust/develop/device-os/user/tests/integration build esomx -v   

device-os-test --device-os-dir=/Users/scottbrust/develop/device-os/ --test-dir=/Users/scottbrust/develop/device-os/user/tests/integration run esomx -v   

Example App

Use test runner / no_fixture_long_running app

References

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Completeness

• User is totes amazing for contributing!
• Contributor has signed CLA (Info here)
• Problem and Solution clearly stated
• Run unit/integration/application tests on device
• Added documentation
• Added to CHANGELOG.md after merging (add links to docs and issues)